Open VPX development platform

Elma Electronic has released a two-slot VPX and Open VPX test and development platform that accommodates 3U and 6U boards via a shelf divider. The E-Frame test platform can connect multiple backplanes to simulate various fabric topologies, eliminating the need for custom backplanes and allowing high speed signals to be passed from one slot to the next.

Developers can power up one or more VPX blades under test and interconnect the J1 fabric connections to emulate the user's application. Signals from an external device can also be introduced through the J1 fabric connector or accessed on the J1 fabric connector using the provided SMA and serial ATA cable headers.
The use of a standard VPX rear transition module plugged into the back provides access to the J0, J2, J3, J4, J5 and J6 connectors, while simultaneously accessing high speed signals in the J1 connector, routed out the side of the backplane. Each slot's J1 A channel is broken out into 16 SMA connectors and the B, C and D channels into four serial ATA 2 cable headers (12 total per slot).
The test platform has a 4cm card pitch that enables cable access to components on either side of the board under test. A built-in LED voltage monitor provides bus voltage compliance, and vector network analysers and other probes can be used on the surface of the VPX card under test for better testing capabilities.
It measures 9U by 42HP (21.3 by 29.8cm) and weighs 8kg. Located on the rear of the chassis, power input voltage is 97 to 264V AC auto-ranging and power input frequency is 47 to 63Hz. Total power consumption is 580W. The platform operates from 0 to +50˚C at altitudes up to 1.8km. It withstands shock of up to 10Gs at 11ms and vibration to 1G at 10 to 330Hz in non-condensing humidity from 5 to 95%.

28 July 2010, Elma Electronic